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- Type of Document: M.Sc. Thesis
- Language: Farsi
- Document No: 58031 (04)
- University: Sharif University of Technology
- Department: Physics
- Advisor(s): Bahrampour, Alireza; Nikaeen, Morteza
- Abstract:
- Limitations in coherence time and gate fidelity are among the most significant obstacles to scaling superconducting quantum computers, both of which are influenced by system noise sources. To control noise, one must first recognize the noise sources in superconducting qubits and then address methods to manage them. The main noise sources in superconducting qubits include charge noise, flux noise, thermal noise, photon number fluctuations, and noise caused by quasiparticles. Control methods include improving superconducting materials, enhancing superconducting chip fabrication techniques, cooling, noise filtering, quantum error correction, and more resilient qubit design and engineering. In the design of superconducting qubits, the topology and geometry of circuits offer high engineering richness for designing various qubits with different degrees of freedom and control parameters. Resilient qubit design means that circuit architectures with various parameters provide different levels of interaction with the surrounding environment, and optimal selection leads to the management and control of designed qubit noise. In this thesis, we first discuss the fundamentals of circuit quantum electrodynamics and introduce various types of superconducting qubits. After introducing different noise sources in superconducting qubits, we examine how to model incoherent processes caused by various noises in system dynamics. Then, we focus on noise control methods in superconducting qubits, specifically reviewing different resilient qubit designs for better noise immunity. Finally, we analyze and compare the impact of basic superconducting qubit architecture in phase and flux regimes on noise control and investigate their effect on qubit coherence time
- Keywords:
- Superconducting Qubits ; Dephasing ; Multimode Qubit ; Coherence Time ; Flux Noise ; Charge Noise
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