Loading...
Search for:
assembled-contilever-probe
0.018 seconds
An Investigation on the Resonant, Frequency and Nonlinear Behavior of Atomic Force Microscope (AFM) Modeled on the Basis of the Nonlocal Theory
, M.Sc. Thesis Sharif University of Technology ; Ahmadian, Mohammad Taghi (Supervisor) ; Mehdigholi, Hamid (Supervisor)
Abstract
Atomic force microscope (AFM) has a significant capability of imaging surface topography on an atomic scale. It is also widely used for Nanolithography in MEMS/NEMS (micro/nanoelectromechanical systems). Although the conventional AFMs have a significant capability of nano-scale surface measurements, their probe tips cannot come in close proximity to the sidewalls, no matter how sharp they are. Therefore, no accurate nano-scale measurements at sidewalls and edges can be achieved by these conventional AFMs. In addition, regarding the increasing applications of micro-structures such as micro nozzles, micro gears, micro holes and micro trenches which all of them have sidewalls and edges,...
Dynamic & Vibration Analysis of AFM Probe Affected by the Non Uniform Potential Field
, M.Sc. Thesis Sharif University of Technology ; Ahmadian, Mohammad Taghi (Supervisor)
Abstract
Atomic force microscope (AFM) has a significant capability of imaging surface topography on an atomic scale. It is also widely used for Nanolithography in MEMS/NEMS (micro/nanoelectromechanical systems). Conventional AFMs consist of a cantilever with a sharp conical or pyramidal tip located at the free end of the cantilever that plays an important role in AFM measurements. Scanning across a surface, AFM interacts with the sample surface through its tip. Although the dynamic behavior of the AFM cantilever is complicated, the researchers have been interested in studying AFM dynamic behavior because it has a great influence on the surface imaging process. The imaging rate and contrast of...