Sharif Digital Repository

Leakage power has already become the major contributor to the total on-chip power consumption, rendering its estimation a necessary step in the IC design flow. The problem is further exacerbated with the increasing uncertainty in the manufacturing process known as process variability. We develop a method to estimate the variation of leakage power in the presence of both intra-die and inter-die process variability. Various complicating issues of leakage prediction such as spatial correlation of process parameters, the effect of different input states of gates on the leakage, and DIBL and stack effects are taken into account while we model the simultaneous variability of the two most critical... 

In this article, we have used quantum and semiclassical models to analyse the electrical characteristics of gate all around silicon nanowire transistor (GAA SNWT). A quantum mechanical transport approach based on non-equilibrium Green's function (NEGF) method with the use of mode space approach in the frame work of effective mass theory has been employed for this analysis. Semiclassical drift diffusion mode space (DDMS) approach has also been used for the simulation of GAA SNWT. We have studied the short-channel effects on the performance of GAA SNWT and evaluated the variation of the threshold voltage, the subthreshold slope (SS), the leakage current and the drain-induced barrier lowering... 

Leakage power has already become the major contributor to the total on-chip power consumption, rendering its estimation a necessary step in the IC design flow. The problem is further exacerbated with the increasing uncertainty in the manufacturing process known as process variability. We develop a method to estimate the variation of leakage power in the presence of both intra-die and inter-die process variability. Various complicating issues of leakage prediction such as spatial correlation of process parameters, the effect of different input states of gates on the leakage, and DIBL and stack effects are taken into account while we model the simultaneous variability of the two most critical...