Loading...

Modeling of a vertical tunneling transistor based on graphene-mos2 heterostructure

Horri, A ; Sharif University of Technology | 2017

1181 Viewed
  1. Type of Document: Article
  2. DOI: 10.1109/TED.2017.2716938
  3. Publisher: Institute of Electrical and Electronics Engineers Inc , 2017
  4. Abstract:
  5. In this paper, for the first time, we present a computational study on the electrical behavior of the field-effect tunneling transistor based on vertical graphene-MoS2 heterostructure and vertical graphene nanoribbon-MoS2 heterostructure. Our simulation is based on nonequilibrium Green's function formalism along with an atomistic tight-binding (TB) model. The TB parameters are obtained by fitting the bandstructure to first-principle results. By using this model, electrical characteristics of device, such as I ON/I OFF ratio, subthreshold swing, and intrinsic gate-delay time, are investigated. We show that the combination of tunneling and thermionic transport allows modulation of current by four orders of magnitude confirming experimental results. The results indicate that the increase of MoS2 layer numbers leads to a higher I ON/I OFF ratio but degrades the intrinsic gate-delay time. Furthermore, it can be observed from the results that as the ribbon width increases the I ON of device increases at the cost of a lower I ON/I OFF ratio. © 1963-2012 IEEE
  6. Keywords:
  7. Graphene heterostructures ; Nonequilibrium green's function (NEGF) ; Tight binding (TB) hamiltonian ; Tunneling transistors ; Atomic layer deposition ; Bins ; Carbon ; Electron tunneling ; Graphene ; Hamiltonians ; Heterojunctions ; Molybdenum ; Molybdenum compounds ; Sulfur ; Transistors ; Computational studies ; Electrical behaviors ; Electrical characteristic ; Graphene nano-ribbon ; Intrinsic gate delay ; Non-equilibrium Green's function ; Non-equilibrium Green's function formalism ; Tight binding ; Graphene transistors
  8. Source: IEEE Transactions on Electron Devices ; Volume 64, Issue 8 , 2017 , Pages 3459-3465 ; 00189383 (ISSN)
  9. URL: https://ieeexplore.ieee.org/document/7962265