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    Elastic fields of interacting point defects within an ultra-thin fcc film bonded to a rigid substrate

    , Article Central European Journal of Engineering ; Volume 3, Issue 4 , 2013 , Pages 707-721 ; 18961541 (ISSN) Shodja, H. M ; Tabatabaei, M ; Ostadhossein, A ; Pahlevani, L ; Sharif University of Technology
    2013
    Abstract
    Certain physical and mechanical phenomena within ultra-thin face-centered cubic (fcc) films containing common types of interacting point defects are addressed. An atomic-scale lattice statics in conjunction with many-body interatomic potentials suitable for binary systems is conducted to analyze the effects of the depth on the: (1) formation energy and layer-by-layer displacements due to the presence of vacancy-octahedral self-interstitial atom (OSIA) ensemble, and (2) elastic fields as well as the free surface shape in the case of vacancy-dopant interaction. Moreover, the effects of the inter-defect spacing for various depths are also examined. To ensure reasonable accuracy and numerical... 

    Surface/interface effect on the scattered fields of an anti-plane shear wave in an infinite medium by a concentric multi-coated nanofiber/nanotube

    , Article European Journal of Mechanics, A/Solids ; Volume 32 , 2012 , Pages 21-31 ; 09977538 (ISSN) Shodja, H. M ; Pahlevani, L ; Sharif University of Technology
    Abstract
    In this paper, the scattering of anti-plane shear waves in an infinite matrix containing a multi-coated nanofiber/nanotube is studied. Based on the fact that the surface to volume ratio for nano-size objects increases, the usual classical theories which generally neglect the surface/interface effects fail to provide reasonable results. Therefore, to analyze the problem the wave-function expansion method is coupled with the surface/interface elasticity theory. In order to provide some quantitative results through consideration of several examples, the knowledge of the relevant surface and/or interface properties of the corresponding constituent materials are required. For this reason, part of... 

    Inclusion problems associated with thin fcc films: linkage between eigenstrain and inter-atomic potential

    , Article Mechanics of Materials ; Volume 39, Issue 8 , 2007 , Pages 803-818 ; 01676636 (ISSN) Shodja, H. M ; Pahlevani, L ; Hamed, E ; Sharif University of Technology
    2007
    Abstract
    Often, during fabrication of thin films on substrates, different types of defects may be introduced into the films. Recently, the determination of the elastic fields due to the self-assembly of quantum dots or strained islands in thin films has been of major concern. In the micromechanical studies, such strained islands are modeled by inclusions. This paper aims to develop a theory pertaining to the presence of nano-inclusions of various geometries within thin films having face centered cubic (fcc) structure. To this end, the notion of eigenstrain is combined with a many body inter-atomic potential suitable for fcc crystals. The interaction between atoms is modeled via Sutton-Chen (SC)... 

    Elastic field of a nano disk shape defect in an fcc thin film

    , Article 2007 2nd IEEE International Conference on Nano/Micro Engineered and Molecular Systems, IEEE NEMS 2007, Bangkok, 16 January 2007 through 19 January 2007 ; 2007 , Pages 142-146 ; 1424406102 (ISBN) ; 9781424406104 (ISBN) Mohammadi Shodja, H ; Pahlevani, L ; Hamed, E ; Sharif University of Technology
    2007
    Abstract
    In this paper, we develop a theory to study the nano defects of various geometries within thin films. The considered thin films have face centered cubic (fee) structure. The eigenstrain method is combined with the long-range Sutton-Chen (SC) inter-atomic potential function which is appropriate for fee crystals. The disturbance caused by a defect in a thin film is determined from the equilibrium equation using the discrete Fourier transformation. The disturbed field is also determined using three dimensional (3D) Molecular Dynamics (MD) simulation in which the constant NVT ensemble is applied to the atomic system. For illustration, the problem of nano disk shape defect in thin film is studied...