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    Optimal sliding mode control of AFM tip vibration and position during manipulation of a nanoparticle

    , Article ASME International Mechanical Engineering Congress and Exposition, Proceedings, 13 November 2009 through 19 November 2009, Lake Buena Vista, FL ; Volume 12, Issue PART A , 2010 , Pages 205-214 ; 9780791843857 (ISBN) Babahosseini, H ; Khorsand, M ; Meghdari, A ; Alasty, A ; Sharif University of Technology
    American Society of Mechanical Engineers (ASME)  2010
    Abstract
    This research regards to a two-dimensional lateral pushing nanomanipulation using Atomic Force Microscope (AFM). Yet a reliable control of the AFM tip position during the AFM-based manipulation process is a chief issue since the tip can jump over the target nanoparticle and then the process can fail. However, a detailed Modeling and understanding of the interaction forces on the AFM tip is important for prosperous manipulation control and a nanometer resolution tip positioning. In the proposed model, Lund-Grenoble (LuGre) dynamic friction model is used as friction force on the contact surface between the nanoparticle and the substrate. This model leads to a stick-slip behavior of the... 

    Dynamics modeling of nanoparticle in AFM-based manipulation using two nanoscale friction models

    , Article ASME International Mechanical Engineering Congress and Exposition, Proceedings, 13 November 2009 through 19 November 2009 ; Volume 12, Issue PART A , 2010 , Pages 225-234 ; 9780791843857 (ISBN) Babahosseini, H ; Mahboobi, S. H ; Meghdari, A ; Sharif University of Technology
    Abstract
    Application of atomic force microscope (AFM) as a manipulator for pushing-based positioning of nanoparticles has been of considerable interest during recent years. Nevertheless comprehensive researches has been done on modeling and the dynamics analysis of nanoparticle behavior during the positioning process. The development of dynamics modeling of nanoparticle is crucial to have an accurate manipulation. In this paper, a comprehensive model of pushing based manipulation of a nanoparticle by AFM probe is presented. The proposed nanomanipulation model consists of all effective phenomena in nanoscale. Nanoscale interaction forces, elastic deformation in contact areas and friction forces in... 

    Mechano-chemical AFM nanolithography of metallic thin films: A statistical analysis

    , Article Current Applied Physics ; Volume 10, Issue 4 , 2010 , Pages 1203-1210 ; 15671739 (ISSN) Akhavan, O ; Abdolahad, M ; Sharif University of Technology
    2010
    Abstract
    A mechano-chemical atomic force microscope (AFM) nanolithography on a metallic thin film (50 nm in thickness) covered by a spin-coated soft polymeric mask layer (50-60 nm in thickness) has been introduced. The surface stochastic properties of initial grooves mechanically patterned on the mask layer (grooves before chemical wet-etching) and the lithographed patterns on the metallic thin film (the grooves after chemical wet-etching) have been investigated and compared by using the structure factor, power spectral density, and AFM tip deconvolution analyses. The effective shape of cross section of the before and after etching grooves have been determined by using the tip deconvolution surface... 

    AFM spectral analysis of self-agglomerated metallic nanoparticles on silica thin films

    , Article Current Nanoscience ; Volume 6, Issue 1 , 2010 , Pages 116-123 ; 15734137 (ISSN) Akhavan, O ; Sharif University of Technology
    2010
    Abstract
    Stochastic parameters of self-agglomerated metallic nanoparticles on a dielectric film surface were studied using atomic force microscopy (AFM) analysis. In this regard, the rough surfaces including the nanoparticles were analyzed and characterized using structure function, roughness exponent and power spectrum density of the AFM profiles and their gradients, for different metal concentrations and heat treatment temperatures. The diffusion parameters, such as activation energy, of the nanoparticles initially accumulated on the surface into a porous and aqueous silica thin film were obtained using the AFM spectral analysis of the profiles and their gradients. It was found that the tip... 

    Physical bounds of metallic nanofingers obtained by mechano-chemical atomic force microscope nanolithography

    , Article Applied Surface Science ; Volume 255, Issue 6 , January , 2009 , Pages 3513-3517 ; 01694332 (ISSN) Akhavan, O ; Abdolahad, M ; Sharif University of Technology
    2009
    Abstract
    To obtain metallic nanofingers applicable in surface acoustic wave (SAW) sensors, a mechano-chemical atomic force microscope (AFM) nanolithography on a metallic thin film (50 nm in thickness)/piezoelectric substrate covered by a spin-coated polymeric mask layer (50-60 nm in thickness) was implemented. The effective shape of cross-section of the before and after etching grooves have been determined by using the AFM tip deconvolution surface analysis, structure factor, and power spectral density analyses. The wet-etching process improved the shape and aspect ratio (height/width) of the grooves and also smoothed the surface within them. We have shown that the relaxed surface tension of the... 

    AFM stochastic analysis of surface twisted nanograin chains of iron oxide: a kinetic study

    , Article Journal of Physics D: Applied Physics ; Volume 42, Issue 6 , 2009 ; 00223727 (ISSN) Akhavan, O ; Azimirad, R ; Sharif University of Technology
    2009
    Abstract
    We have studied the stochastic parameters of surface iron oxide nanograin chains, 97 nm in diameter and 2.4 νm in length, prepared at different annealing temperatures, using atomic force microscopy (AFM) spectral analysis. In this regard, the roughness of the thin films including self-assembled twisted nanograin chains has been analysed and characterized using the height-height correlation function, the roughness exponent as well as the power spectrum density of the AFM profiles and their gradient, for the different annealing temperatures. The tip convolution effect on the stochastic parameters under study has also been investigated. The kinetics of the formation of nanograins on the film... 

    Torsional sensitivity and resonant frequency of an AFM with parallel sidewall probes

    , Article Proceedings of the ASME Design Engineering Technical Conference, 15 August 2010 through 18 August 2010, Montreal, QC ; Volume 5 , 2010 , Pages 987-996 ; 9780791844137 (ISBN) Ahmadian, M. T ; Kahrobaiyan, M. H ; Haghighi, P ; Yousefi, A ; Sharif University of Technology
    2010
    Abstract
    The resonant frequencies and torsional sensitivities of an atomic force microscope (AFM) assembled cantilever probe which comprises a horizontal cantilever, two vertical extensions and two tips located at their free ends are studied. This probe makes the AFM capable of measuring, for instance, the outer/inner diameter, roundness and roughness of microstructures like micro-holes and micro nozzles which leads to a time-saving swift scanning process. In this work, the effects of the sample surface contact stiffness and the geometrical parameters such as the ratio of the vertical extension length to the horizontal cantilever length and the distance of the first vertical extension from the... 

    Effect of chemical substitution on the morphology and optical properties of Bi1-xCaxFeO3 films grown by pulsed-laser deposition

    , Article Journal of Materials Science: Materials in Electronics ; Volume 24, Issue 1 , 2013 , Pages 248-252 ; 09574522 (ISSN) Ahadi, K ; Mahdavi, S. M ; Nemati, A ; Sharif University of Technology
    2013
    Abstract
    The morphological characteristics as well the optical properties of Ca-doped BiFeO3 films grown by pulsed-laser deposition technique have been investigated. AFM images revealed that calcium has a radical effect on the surface features of BiFeO3 films. By utilizing spectrophotometer, transmission behaviour of the films was investigated. Local IV characteristics of the films disclosed about three orders of magnitude enhancement concerning electrical conductivity through Ca doping. X-ray photoelectron spectroscopy results revealed that Ca can reduce the valence state of iron in the compound  

    Electronic structure and morphological study of BaTiO 3 film grown by pulsed-laser deposition

    , Article Materials Letters ; Volume 72 , April , 2012 , Pages 107-109 ; 0167577X (ISSN) Ahadi, K ; Mahdavi, S. M ; Nemati, A ; Tabesh, M ; Ranjbar, M ; Sharif University of Technology
    Abstract
    The morphological characteristics and electronic structure of the BaTiO 3 films grown by pulsed-laser deposition technique have been investigated. AFM and FE-SEM images reveal columnar growth characteristic of these films. Utilizing spectrophotometer, optical band gap of the films were reckoned to be about 3.76 eV. Both dα/dE and PL vs. E plots reveal numerous luminance states in the gap. Despite the presence of many luminance faults in the gap, cations manage to preserve their electronic states  

    Thermo- and pH-sensitive dendrosomes as bi-phase drug delivery systems

    , Article Nanomedicine: Nanotechnology, Biology, and Medicine ; Volume 9, Issue 8 , 2013 , Pages 1203-1213 ; 15499634 (ISSN) Adeli, M ; Fard, A. K ; Abedi, F ; Chegeni, B. K ; Bani, F ; Sharif University of Technology
    2013
    Abstract
    Fully supramolecular dendrosomes (FSD) as bi-phase drug delivery systems are reported in this work. For preparation of FSD, amphiphilic linear-dendritic supramolecular systems (ALDSS) have been synthesized by host-guest interactions between hyperbranched polyglycerol having β-cyclodextrin core and bi-chain polycaprolactone (BPCL) with a fluorescine focal point. Self-assembly of ALDSS in aqueous solutions led to FSD. They were able to encapsulate paclitaxel with a high loading capacity. The dendrosome-based drug delivery systems were highly sensitive to pH and temperature. They were stable at 20-37. °C and pH7-8, but dissociated and released drug at temperatures lower than 20. °C or higher... 

    Dynamics of the nanoneedle probe in trolling mode AFM

    , Article Nanotechnology ; Volume 26, Issue 20 , April , 2015 ; 09574484 (ISSN) Abdi, A ; Pishkenari, H. N ; Keramati, R ; Minary Jolandan, M ; Sharif University of Technology
    Institute of Physics Publishing  2015
    Abstract
    Atomic force microscopy (AFM), as an indispensable tool for nanoscale characterization, presents major drawbacks for operation in a liquid environment arising from the large hydrodynamic drag on the vibrating cantilever. The newly introduced 'Trolling mode' (TR-mode) AFM resolves this complication by using a specialized nanoneedle cantilever that keeps the cantilever outside of the liquid. Herein, a mechanical model with a lumped mass was developed to capture the dynamics of such a cantilever with a nanoneedle tip. This new developed model was applied to investigate the effects of the needle-liquid interface on the performance of the AFM, including the imaging capability in liquid