Sharif Digital Repository

Gold and copper thin films are widely used in microelectromechanical system (MEMS) and nanoelectromechanical system (NEMS) devices. Nanoindentation has been developed in mechanical characterization of thin films in recent years. Several researchers have examined the effect of surface roughness on nanoindentation results. It is proved that the surface roughness has great importance in nanoindentation of thin films. In this paper, the surface topography of thin films is simulated using the extracted data from the atomic force microscopy (AFM) images. Nanoindentation on a rough surface is simulated using a three-dimensional finite-element model. The results are compared with the results of... 

In this paper we have studied both DC size effect and anomalous skin effect caused by surface and grain boundary scattering on the resistivity of Cu thin films by a Monte Carlo method. Contribution of each scattering mechanism and the interaction between them are analyzed separately. A simple and fast numerical recursive method is also introduced to guess the structure of electric field and distribution of current inside the thin film to evaluate the surface resistance instead of complicated analytical formulas  

We present a new approach for analytical modeling and calculating the response of high-Tc superconductive transition edge sensors in a wide range of modulation frequencies for different configurations of the film patterns. The method used here is based on solving the heat transfer differential equation for two different time varying heat sources, which are related to the absorbed radiated power. The used method employs two-dimensional boundary conditions for describing meander-line patterned devices. The results from the applied method are in better agreement with those obtained from the frequency response measurements of the characterized samples, than the previously developed models. In...