Loading...

Dynamic modeling and sensitivity analysis of atomic force microscope pushing force in nanoparticle manipulation on a rough substrate [electronic resource]

Babahosseini, H. (Hesam) ; Sharif University of Technology

940 Viewed
  1. Type of Document: Article
  2. DOI: 10.1166/asem.2013.1316
  3. Abstract:
  4. An Atomic Force Microscope (AFM) is a capable tool to manipulate nanoparticles by exerting pushing force on the nanoparticles located on the substrate. In reality, the substrate cannot be considered as a smooth surface particularly at the nanoscale. Hence, the particle may encounter a step on the substrate during a manipulation. In this study, dynamics of the nanoparticle on a stepped substrate and critical pushing force in the manipulation are investigated. There are two possible dynamic modes that may happen in the manipulation on the stepped substrate. In one mode, the nanoparticle may slide on the step edge and then climb up to the step which is a desired mode. Another possible mode is that the tip slides on the particle which causes the manipulation task to fail. For better understanding of nano-particles manipulation and inducing the desired dynamic mode, we create a model of the particle dynamics during positioning on a rough surface. Occurrence of each dynamic mode depends on the friction forces on the contact surfaces. The friction force in this model includes both normal and adhesion forces. Elastic deformations and pull-off forces on the contact surfaces are determine by Johnson–Kendall–Roberts (JKR) model. Then, governing dynamics of the AFM and the particle are derived and simulated. The results show the upper and the lower bounds of the critical pushing force versus variation of systems parameters. Based on the results of the modeling, the efficiency of manipulating can be improved by selecting the adjustable system parameters such as AFM cantilever's geometry, mechanical property, and initial conditions
  5. Keywords:
  6. Atomic force microscope (AFM) ; Dynamic analysis ; Nanomanipulation ; Pushing force ; Rough substrate
  7. Source: Journal of Advanced Science, Engineering and Medicine ; 2013, Vol. 5, pp. 1-10
  8. URL: http://www.ingentaconnect.com/content/asp/asem/2013/00000005/00000008/art00007