Dynamic modeling and sensitivity analysis of atomic force microscope pushing force in nanoparticle manipulation on a rough substrate [electronic resource]
Babahosseini, H. (Hesam)
Dynamic modeling and sensitivity analysis of atomic force microscope pushing force in nanoparticle manipulation on a rough substrate [electronic resource]
Author :
Babahosseini, H. (Hesam)
Publisher :
Pub. Year :
Subjects :
Atomic force microscope (AFM)
Dynamic analysis
Nanomanipulation
Pushing force
Rough...