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EA-EO: Endurance aware erasure code for SSD-based storage systems

Chamazcoti, S. A ; Sharif University of Technology

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  1. Type of Document: Article
  2. DOI: 10.1109/PRDC.2014.18
  3. Abstract:
  4. One of the main issues in Solid State Drive (SSD)-based storage systems is endurance which is directly affected by the number of Program/Erase (P/E) cycles. The increment of P/E cycles increases the bit error rate threatening the reliability of SSDs. Erasure codes are used to leverage the reliability of storage systems but they also affect the number of P/E cycles based on their code pattern. A lower dependency between data and parities in the code pattern may lead to smaller number of P/E cycles providing better endurance. This paper introduces an Endurance Aware EVENODD (EA-EO), which minimizes the dependency between data and parities in the coding pattern. A simulation environment is used to compare the write-cycles of EA-EO with EVENODD in terms of different request size. The results show that the endurance improvement of EA-EO code could be as high as 44%. Furthermore, performance analysis of these codes in terms of parity construction and failure recovery shows that the number of XOR-operations is reduced in EA-EO compared to EVENODD
  5. Keywords:
  6. Endurance ; Erasure code ; P/E cycles ; Reliability ; Solid State Disk ; Bit error rate ; Digital storage ; Durability ; Forward error correction ; Hard disk storage ; Coding patterns ; Endurance improvement ; Failure recovery ; Performance analysis ; Simulation environment ; Solid state disks ; Solid state drives (SSD) ; Codes (symbols)
  7. Source: Proceedings of IEEE Pacific Rim International Symposium on Dependable Computing, PRDC ; 3 December , 2014 , Pages 76-85 ; ISSN: 15410110 ; ISBN: 9781479964741
  8. URL: http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6974774