Sharif Digital Repository / Sharif University of Technology
    • [Zoom In]
    • [Zoom Out]
  • Page 
    		 of  0
  • [Next Page]
  • [Previous Page]
  • [Fullscreen view]
  • [Close]
 
Design of robust SRAM cells against single-event multiple effects for nanometer technologies
Rajaei, R

Cataloging brief

Design of robust SRAM cells against single-event multiple effects for nanometer technologies
Author :   Rajaei, R
Publisher :  
Pub. Year  :   2015
Subjects :   Single event multiple effect (SEME) Single event upset (SEU) Soft error SRAM cell ...
Call Number :  

Find in content

sort by

Bookmark
Loading...