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RAW-Tag: Replicating in altered cache ways for correcting multiple-bit errors in tag array

Farbeh, H ; Sharif University of Technology | 2019

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  1. Type of Document: Article
  2. DOI: 10.1109/TDSC.2017.2706263
  3. Publisher: Institute of Electrical and Electronics Engineers Inc , 2019
  4. Abstract:
  5. Tag array in on-chip caches is one of the most vulnerable components to radiation-induced soft errors. Protecting the tag array in some processors is limited to error detection using the parity check, since the overheads of error correcting codes are not affordable in this component. State-of-The-Art tag protection schemes combine the parity check with replication to provide error correction capability. Classifying these replication-based schemes into partial-replication and full-replication, the former offers a low overhead protection in which a large fraction of detectable errors remain uncorrectable, whereas the latter imposes a significant overhead to correct all of the errors. This paper proposes a low overhead full-replication scheme, so called Replicating in Altered Ways of Tag (RAW-Tag), to correct all detectable errors. RAW-Tag manipulates the cache replacement algorithm and keeps track of the incoming/evicting cache lines to not only provide a replica for all tags, but also eliminate the simultaneous susceptibility of both a tag and its replica to a single Multiple-Bit Upset (MBU). The simulation results show that RAW-Tag imposes no performance overhead and increases the energy consumption of L1 and L2 caches by only 6.6 and 0.3 percent, respectively, as compared with the baseline. © 2004-2012 IEEE
  6. Keywords:
  7. Cache memories ; Multiple-bit upset ; Soft errors ; Buffer storage ; Cache memory ; Energy utilization ; Radiation hardening ; Error-checking ; Multiple bit upset ; Redundant design ; Soft error ; Tag replication ; Error correction
  8. Source: IEEE Transactions on Dependable and Secure Computing ; Volume 16, Issue 4 , 2019 , Pages 651-664 ; 15455971 (ISSN)
  9. URL: https://ieeexplore.ieee.org/abstract/document/7931629