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Impact of holmium on structural, dielectric and magnetic properties of Cu–Zn spinel ferrites synthesized via sol–gel route

Akhter, M. J ; Sharif University of Technology | 2021

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  1. Type of Document: Article
  2. DOI: 10.1007/s10854-020-04986-0
  3. Publisher: Springer , 2021
  4. Abstract:
  5. The mixed nano-ferrites materials Cu0.6Zn0.4HoxFe2−xO4 (0.00 ≤ x ≤ 0.12) were prepared via the sol–gel auto combustion technique. The TGA curve established the annealing temperature (500 °C) for phase formation. The single exothermic peak on the DSC plot occurred at 341 °C temperature. XRD patterns of these nano ferrites verified single phase formation of the FCC cubic structure. The lattice constant a was increased from 8.4244 to 8.4419 Å and then its value decreased to 8.4319 Å. Crystallite size was found in the range of 7 to 16 nm. The surface morphology of the samples was observed from the scanning electron microscope (SEM) images. The grain size was found within the range of 90 nm to 106 nm. Energy-dispersive X-ray (EDX) results showed the significant substitution of Ho in Cu–Zn spinel ferrites. Dielectric parameters such as dielectric constant, dielectric constant factor, and tan loss depicted a decreasing trend with Ho3+ ions concentration. The single-domain ferrimagnetism is confirmed by the squareness ratio, which is < 0.5. The Ms was found to be decreased while Hc was increased. The significant results of the dielectric as well as magnetic properties of these nano ferrites suggested their use in high-frequency devices applications. © 2021, The Author(s), under exclusive licence to Springer Science+Business Media, LLC part of Springer Nature
  6. Keywords:
  7. Copper metallography ; Crystallite size ; Ferrites ; Holmium ; Magnetic properties ; Morphology ; Scanning electron microscopy ; Sols ; Surface morphology ; Annealing temperatures ; Dielectric and magnetic properties ; Dielectric parameters ; Energy dispersive x-ray ; High frequency devices ; Phase formations ; Squareness ratio ; The scanning electron microscopes (SEM) ; Zinc metallography
  8. Source: Journal of Materials Science: Materials in Electronics ; Volume 32, Issue 2 , 2021 , Pages 2205-2218 ; 09574522 (ISSN)
  9. URL: https://link.springer.com/article/10.1007/s10854-020-04986-0