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Tip and sample flexibility effects on tapping mode (amplitude modulation) AFM measurements

Pishkenari, H. N ; Sharif University of Technology | 2011

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  1. Type of Document: Article
  2. DOI: 10.1049/mnl.2011.0540
  3. Publisher: 2011
  4. Abstract:
  5. This Letter is devoted to the investigation of the tip, substrate and particle flexibility effects on the elastic deformation, the maximum repulsive force and the topography images in tapping mode (amplitude modulation) atomic force microscopy (TM-AFM). Several quantitative comparisons among the different models are presented and the effects of the elastic deformations on TM-AFM measurement are investigated
  6. Keywords:
  7. AFM ; Quantitative comparison ; Repulsive forces ; Tapping modes ; Topography images ; Atomic force microscopy ; Elastic deformation ; Amplitude modulation ; Carbon ; Nanodiamond ; Atomic particle ; Controlled study ; Elasticity ; Entropy ; Molecular interaction ; Quantitative analysis ; Sample
  8. Source: Micro and Nano Letters ; Volume 6, Issue 12 , December , 2011 , Pages 1023-1028 ; 17500443 (ISSN)
  9. URL: http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=6111576&url=http%3A%2F%2Fieeexplore.ieee.org%2Fiel5%2F11102%2F6111563%2F06111576.pdf%3Farnumber%3D6111576