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Simulations of surface defects characterization using force modulation atomic force microscopy

Nejat Pishkenari, H ; Sharif University of Technology | 2010

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  1. Type of Document: Article
  2. DOI: 10.1115/DETC2009-86188
  3. Publisher: 2010
  4. Abstract:
  5. This paper is devoted to the characterization of the surface defects using a recently developed AFM technique named as frequency and force modulation AFM (FFM-AFM). The simulated system includes a recently developed gold coated AFM probe which interacts with a sample including single-atom vacancy and impurities. In order to examine the behavior of the above system including different transition metals, molecular dynamics (MD) simulation with Sutton-Chen (SC) interatomic potential is used. Along this line, an imaging simulation of the probe and sample is performed, and the effects of the horizontal scan speed, the effective frequency set-point, the cantilever stiffness, the tip-sample rest position and the cantilever quality factor on the resulting images are investigated. Using a proposed optimum controlling scheme for the excitation force amplitude, the cantilever horizontal speed can be maximized
  6. Keywords:
  7. AFM ; AFM probe ; Cantilever stiffness ; Excitation force ; Force modulation ; Gold-coated ; Horizontal scan ; Imaging simulation ; Interatomic potential ; Molecular dynamics simulations ; Quality factors ; Set-point ; Simulated system ; Gold coatings ; Molecular dynamics ; Nanocantilevers ; Probes ; Scanning electron microscopy ; Surface defects ; Transition metals ; Atomic force microscopy
  8. Source: Proceedings of the ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference 2009, DETC2009, 30 August 2009 through 2 September 2009 ; Volume 6 , August–September , 2010 , Pages 681-687 ; 9780791849033 (ISBN)
  9. URL: http://proceedings.asmedigitalcollection.asme.org/proceeding.aspx?articleid=1650199