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Phase-noise measurement of microwave oscillators using phase-shifterless delay-line discriminator

Gheidi, H ; Sharif University of Technology | 2010

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  1. Type of Document: Article
  2. DOI: 10.1109/TMTT.2009.2038452
  3. Publisher: 2010
  4. Abstract:
  5. In this paper, a modified method based on the frequency discriminator technique for measuring phase noise of microwave oscillators is presented. In the proposed method, the phase shifter is omitted. In contrast, a 90° hybrid with one more channel containing a phase detector, and a low-noise amplifier is added to the measurement setup. It can be said that an in-phase/quadrature phase-noise detection has been developed. With the proposed method, tuning of the variable phase shifter is not needed anymore. Therefore, the measurement is done automatically, and as a result, the measurement time is decreased. Another considerable advantage of this method is that the method is theoretically self-calibrated. For verifying the accuracy of the method, a measurement setup based on the proposed method was established. Two relatively low phase-noise phase-locked oscillators at frequencies of 2.8 and 4.9 GHz were designed. Their phase noise was measured by the proposed method, the conventional delay-line method, and the two-oscillator technique. Comparison of the measured data of the three methods shows the validity of the proposed method
  6. Keywords:
  7. Delay line ; Delay-line discriminators ; Frequency discriminators ; In-phase/quadrature ; Low-phase-noise ; Measured data ; Measurement setup ; Measurement time ; Phase detectors ; Phase locked oscillators ; Phase noise measurement ; Variable phase shifters ; Acoustic noise measurement ; Antenna phased arrays ; Audio frequency amplifiers ; Discriminators ; Measurements ; Microwaves ; Phase noise ; Phase shift ; Phase shifters ; Waves ; Microwave oscillators
  8. Source: IEEE Transactions on Microwave Theory and Techniques ; Volume 58, Issue 2 , January , 2010 , Pages 468-477 ; 00189480 (ISSN)
  9. URL: http://ieeexplore.ieee.org/document/5395601/?reload=true