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Soft Error Rate Estimation in Presence of Multiple Event Transients (METs)

Javanmardi, Mahdi | 2013

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  1. Type of Document: M.Sc. Thesis
  2. Language: Farsi
  3. Document No: 44907 (19)
  4. University: Sharif University of Technology
  5. Department: Computer Engineering
  6. Advisor(s): Miremadi, Ghasem
  7. Abstract:
  8. With continuous device down-scaling and increase in transistor counts on a chip, complementary metal-oxide-semiconductor (CMOS) technology has become extremely sensitive to soft errors. Soft errors are transient errors caused by energetic particles such as neutrons and alpha particles. An essential step to design a soft error tolerant digital system with minimal performance and power overheads is Soft Error Rate (SER) estimation of system components. Until recently, Single Event Upsets (SEUs) in latches and Filp-Flops (FFs) and Single Event Transients (SETs) in combinational logic parts of digital circuits were regarded as the main effects of particle strikes. However, with the emerging nanoscale technologies, a high energy particle can affect two or more adjacent nodes in the circuit resulting in Multiple Bit Upsets (MBUs) in the sequential and Multiple Event Transients (METs) in the combinational components. Therefore, it is necessary to carefully consider MBUs and METs for the accurate SER estimation of a given digital circuit.
    In this thesis, a fast and accurate layout-based SER estimation technique is proposed for estimation of the overall SER of the circuits. The proposed technique fully supports both Single and Multiple Event Transients. Unlike previous techniques in which MET sites are obtained from netlist, the proposed technique performs detailed layout analysis to accurately extract adjacent fault sites. Also, the proposed technique accurately computes all three masking factors, namely, logical, electrical and timing masking. Experimental results and comparisons with Statical Fault Injections (SFIs) using Monte-Carlo simulations confirm the accuracy (under 3% difference) of the proposed technique
  9. Keywords:
  10. Fault Tolerance ; Soft Error Rate Estimation ; Single Event Transient Error ; Multiple Event Transient Error

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