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Evaluation of fault-tolerant designs implemented on SRAM-based FPGAs

Asadi, G ; Sharif University of Technology | 2004

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  1. Type of Document: Article
  2. DOI: 10.1109/PRDC.2004.1276583
  3. Publisher: 2004
  4. Abstract:
  5. The technology of SRAM-based devices is sensible to Single Event Upsets (SEUs) that may be induced mainly by high energy heavy ions and neutrons. This paper presents a framework for the evaluation of fault-tolerant designs implemented on SRAM-based FPGAs using emulated SEUs. The SEU injection process is performed by inserting emulated SEUs in the device using its configuration bitstream file. An Altera FPGA, i.e. the Flex10K200, and the ITC'99 benchmark circuits are used to experimentally evaluate the method. The results show that between 32 to 45 percent of SEUs injected to the device propagate to the output terminals of the device
  6. Keywords:
  7. Fault tolerance ; Logic devices ; Application specific integrated circuits ; Costs ; Aerospace electronics ; Prototypes ; Application software ; Single event upset ; Field programmable gate arrays ; Single event transient
  8. Source: Proceedings - 10th IEEE Pacific Rim International Symposium on Dependable Computing, Papeete Tahiti, 3 March 2004 through 5 March 2004 ; 2004 , Pages 327-332 ; 0769520766 (ISBN); 9780769520766 (ISBN)
  9. URL: https://ieeexplore.ieee.org/document/1276583