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Simulation of imaging in tapping-mode atomic-force microscopy: A comparison amongst a variety of approaches

Pishkenari, H. N ; Sharif University of Technology | 2011

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  1. Type of Document: Article
  2. DOI: 10.1088/0022-3727/44/7/075303
  3. Publisher: 2011
  4. Abstract:
  5. Models capable of accurate simulation of microcantilever dynamics coupled with complex tip-sample interactions are essential for interpretation and prediction of the imaging results in amplitude modulation or tapping-mode atomic-force microscopy (AM-AFM or TM-AFM). In this paper, four approaches based on combinations of lumped and finite element methods for modelling of cantilever dynamics, and van derWaals and molecular dynamics for modelling of tip-sample interactions, are used to simulate the precise imaging by AM-AFM. Based on the simulated imaging and force determination, the efficiency of different modelling schemes is evaluated. This comparison is performed considering their coincidence with the realistic behaviour of AM-AFM in imaging of nanoscale features. In the conducted simulations, a diamond tip is used to scan a C60 molecule absorbed on a graphite substrate. The effects of amplitude set-point, cantilever stiffness and quality factor on the accuracy of different modelling approaches are studied
  6. Keywords:
  7. AFM ; C60 molecules ; Cantilever stiffness ; Diamond tip ; Force determination ; Graphite substrate ; Micro-cantilevers ; Nanoscale features ; Quality factors ; Set-point ; Tapping modes ; Tip-sample interaction ; Amplitude modulation ; Computer simulation ; Finite element method ; Molecular dynamics ; Nanocantilevers ; Atomic force microscopy
  8. Source: Journal of Physics D: Applied Physics ; Volume 44, Issue 7 , February , 2011 ; 00223727 (ISSN)
  9. URL: http://iopscience.iop.org/article/10.1088/0022-3727/44/7/075303/meta;jsessionid=0B7990421A72198B91815E2F4788CCE0.c3.iopscience.cld.iop.org