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Optical properties and morphology analysis of hexagonal WO3 thin films obtained by electron beam evaporation

Shakoury, R ; Sharif University of Technology | 2020

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  1. Type of Document: Article
  2. DOI: 10.1007/s10854-020-04858-7
  3. Publisher: Springer , 2020
  4. Abstract:
  5. WO3 films with thicknesses between 550 and 853 nm were deposited on glass substrates using the electron beam evaporation method at room temperature. The microstructures and surface roughness of the films were studied by X-ray diffraction (XRD) and atomic force microscopy (AFM). It was observed that the crystalline structure of the WO3 thin films significantly changes from the amorphous to crystalline states with a crystalline texture, and the mosaicity and grain size dependent on the film thickness. The transmittance spectra of the obtained WO3 films were measured in the range from 340 to 850 nm, and the Swanepoel method was used to determine the refractive indices and the thicknesses of the WO3 films. The obtained optical functions reveal the highly homogeneous structure of the films. © 2020, Springer Science+Business Media, LLC, part of Springer Nature
  6. Keywords:
  7. Atomic force microscopy ; Electron beams ; Evaporation ; Morphology ; Physical vapor deposition ; Refractive index ; Substrates ; Surface roughness ; Textures ; Thin films ; Tungsten compounds ; Crystalline state ; Crystalline structure ; Crystalline texture ; Electron beam evaporation ; Electron beam evaporation methods ; Homogeneous structure ; Morphology analysis ; Transmittance spectra ; Optical films
  8. Source: Journal of Materials Science: Materials in Electronics ; 2020
  9. URL: https://link.springer.com/article/10.1007/s10854-020-04858-7