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A markovian performance model for networks-on-chip

Kiasari, A. E ; Sharif University of Technology | 2008

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  1. Type of Document: Article
  2. DOI: 10.1109/PDP.2008.83
  3. Publisher: 2008
  4. Abstract:
  5. Network-on-Chip (NoC) has been proposed as a solution for addressing the design challenges of future high-performance nanoscale architectures. Thus, it is of crucial importance for a designer to ha ve access to fast methods for evaluating the performance of on-chip networks. To this end, we present a Markovian model for evaluating the latency and energy consumption of on-chip networks. We compute the a verage delay due to path contention, virtual channel and crossbar switch arbitration using a queuing-based approach, which can capture the blocking phenomena of wormhole switching quite accurately. The model is then used to estimate the power consumption of all routers in NoCs. The performance results from the analytical models are validated with those obtained from a synthesizable VHDL-based cycle accurate simulator. Comparison with simulation results indicate that die proposed analytical model is quite accurate and can be used as an efficient design tool by SoC designers. © 2008 IEEE
  6. Keywords:
  7. Computer architecture ; Electric network topology ; Embedded systems ; Energy policy ; Network architecture ; Routers ; Analytical modelling ; Blocking phenomenon ; Crossbar switching ; Cycle accurate simulator (CAS) ; Design challenges ; Design tools ; Energy consumption ; Fast methods ; Markovian ; Markovian models ; Nanoscale architectures ; Network-on-chip (NoC) ; Networks on chip (NoCs) ; On chip network (OCN) ; Performance modelling ; Performance results ; Power consumption (CE) ; Simulation results ; Virtual channels ; Wormhole switching ; Computer simulation
  8. Source: Proceedings of the 16th Euromicro Conference on Parallel, Distributed and Network-Based Processing, PDP 2008, 13 February 2008 through 15 February 2008, Toulouse ; 2008 , Pages 157-164 ; 0769530893 (ISBN); 9780769530895 (ISBN)
  9. URL: https://ieeexplore.ieee.org/document/4457119