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Investigation of transient effects on FPGA-based embedded systems

Bakhoda, A ; Sharif University of Technology | 2005

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  1. Type of Document: Article
  2. DOI: 10.1109/ICESS.2005.66
  3. Publisher: 2005
  4. Abstract:
  5. In this paper, we present an experimental evaluation of transient effects on an embedded system which uses SRAM-based FPGAs. A total of 7500 transient faults were injected into the target FPGA using Power Supply Disturbances (PSD) and a simple 8-bit microprocessor was implemented on the FPGA as the testbench. The results show that nearly 64 percent of faults cause system failures and about 63 percent of the faults lead to corruption of the configuration data of the FPGA chip. © 2005 IEEE
  6. Keywords:
  7. Computer architecture ; Field programmable gate arrays (FPGA) ; Microprocessor chips ; Static random access storage ; Power supply disturbances (PSD) ; System failures ; Transient effects ; Embedded systems
  8. Source: ICESS 2005 - 2nd International Conference on Embedded Software and Systems, Xian, 16 December 2005 through 18 December 2005 ; Volume 2005 , 2005 , Pages 231-236 ; 0769525121 (ISBN); 9780769525129 (ISBN)
  9. URL: https://ieeexplore.ieee.org/document/1609881