Loading...

Experimental evaluation of transient effects on SRAM-based FPGA chips

Bakhoda, A ; Sharif University of Technology | 2005

142 Viewed
  1. Type of Document: Article
  2. DOI: 10.1109/ICM.2005.1590078
  3. Publisher: 2005
  4. Abstract:
  5. This paper presents an experimental evaluation of transient effects on SRAM-based FPGAs. A total of 9000 transient faults were injected into the target FPGA using Power Supply Disturbances (PSD). The results show that nearly 60 percent of faults cause system failures and about 58 percent of the faults lead to corruption of the configuration data of the FPGA chip. © 2005 IEEE
  6. Keywords:
  7. Computer system recovery ; Microprocessor chips ; Static random access storage ; Transients ; Power Supply Disturbances (PSD) ; Transient effects ; Transient faults ; Field programmable gate arrays (FPGA)
  8. Source: 17th 2005 International Conference on Microelectronics, ICM 2005, Islamabad, 13 December 2005 through 15 December 2005 ; Volume 2005 , 2005 , Pages 251-255 ; 0780392620 (ISBN); 9780780392625 (ISBN)
  9. URL: https://ieeexplore.ieee.org/document/1590078