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Challenges of finite element analysis of re-solvers

Saneie, H ; Sharif University of Technology | 2018

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  1. Type of Document: Article
  2. DOI: 10.1109/TEC.2018.2881465
  3. Publisher: Institute of Electrical and Electronics Engineers Inc , 2018
  4. Abstract:
  5. Nowadays position sensors are increasingly used in many applications. One of the most commonly used sensors are resolvers. There are different types of resolvers including Wound Rotor (WR) resolvers, Variable Air-gap Length Variable Reluctance (VAGL-VR) resolvers, and Sinusoidal Rotor Variable Reluctance (SR-VR) resolvers. Regardless of the resolvers’ configurations, including linear, cylindrical and disk type, finite element analysis (FEA) is inseparable part of design and performance evaluation of these magnetic sensors. The scope of this study is to discuss challenges in the FEA of resolvers. The influence of mesh quality, time steps, stop time, excitation methods including volt-age source and current source and signal processing methods are investigated in details. Then a key question in analysis of resolvers is answered. The question is “Is Total Harmonic Distortion (THD) of induced voltages' envelopes a suitable criterion for performance evaluation of resolvers?” Finally, four prototypes of different types of resolvers are used for experimental tests. Good agreements are obtained between simulation and test results indicating the accuracy of following discussions. IEEE
  6. Keywords:
  7. Finite element analysis ; Position Error ; Position Sensor ; Resolver ; Rotors ; Signal resolution ; Stator cores ; Time Stepping Finite Element Method (TSFEM) ; Windings ; Electric windings ; Harmonic distortion ; Reliability ; Reliability analysis ; Rotors ; Rotors (windings) ; Sensors ; Signal processing ; Wave filters ; Position errors ; Position sensors ; Stator core ; Time-stepping finite element method ; Total Harmonic Distortion (THD) ; Finite element method
  8. Source: IEEE Transactions on Energy Conversion ; 2018 ; 08858969 (ISSN)
  9. URL: https://ieeexplore.ieee.org/document/8537993