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MOD growth of epitaxial cerium oxide buffer layer on LAO substrates for fabrication of c-axis oriented YBCO

Hosseini, M ; Sharif University of Technology | 2012

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  1. Type of Document: Article
  2. DOI: 10.1049/mnl.2012.0492
  3. Publisher: 2012
  4. Abstract:
  5. Epitaxial cerium oxide (CeO2) buffer layer has been grown on lanthanum aluminate (LAO) single crystal substrates for fabrication of c-axis oriented YBa2Cu3O7-x (YBCO). Precursor solution of cerium acetylacetonates with viscosity of 0.6 centipoises was spin coated on the 1×1 cm area LAO substrates. The calcination was carried out by very slow ramp (1°C per minute) until the final temperature of 500°C in oxygen flow to remove most of the organic compounds. The final heat treatment has been done at 780°C by a ramp of 20° per minute in gas flow of mixed argon-oxygen with 5 Pa partial pressure of oxygen. The thickness of the deposited CeO2 buffer layer was 20 nm. Then, 100 nm thick YBCO film was deposited by sputtering on the CeO2 buffered LAO substrate. Another film with same deposition conditions was also fabricated on the bare LAO crystal for comparison. The scanning electron microscopy (SEM) and X-ray diffraction characterisations show a/b axis YBCO decreases significantly when using the CeO2 buffered LAO instead of the bare LAO. R-T and Jc measurements of the samples are also reported. Superconducting transition width of the fabricated film on the substrate with CeO2 buffer layer is less than 0.4 K and the Jc of the fabricated film is above 3.5 MA/cm2
  6. Keywords:
  7. Cerium oxide buffer layer ; Deposition conditions ; Final heat treatments ; Partial pressure of oxygen ; Precursor solutions ; Single crystal substrates ; Superconducting transition width ; Buffer layers ; Calcination ; Deposits ; Epitaxial growth ; Fabrication ; Superconducting films ; Yttrium barium copper oxides ; Substrates ; Buffer ; Cerium oxide ; Inorganic compound ; Lanthanum aluminate ; Nanofilm ; Oxygen ; Unclassified drug ; Crystal structure ; Gas flow ; Nanofabrication ; Oxygen tension ; Scanning electron microscopy ; Superconductor ; Thickness ; X ray diffraction
  8. Source: Micro and Nano Letters ; Volume 7, Issue 10 , 2012 , Pages 1008-1010 ; 17500443 (ISSN)
  9. URL: http://ieeexplore.ieee.org/xpl/abstractAuthors.jsp?arnumber=6407203