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A layout-based approach for multiple event transient analysis

Ebrahimi, M ; Sharif University of Technology | 2013

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  1. Type of Document: Article
  2. DOI: 10.1145/2463209.2488858
  3. Publisher: 2013
  4. Abstract:
  5. With the emerging nanoscale CMOS technology, Multiple Event Transients (METs) originated from radiation strikes are expected to become more frequent than Single Event Transients (SETs). In this paper, a fast and accurate layout- based Soft Error Rate (SER) estimation technique with consideration of both SET and MET fault models is pro- posed. Unlike previous techniques in which the adjacent MET sites are obtained from logic-level netlist, we perform a comprehensive layout analysis to extract MET adjacent cells. It is shown that layout-based technique is the only effective solution for identification of adjacent cells as netlist-based techniques significantly underestimate the overall SER. Copyright
  6. Keywords:
  7. Error propagation ; Soft errors ; Transient errors ; Effective solution ; Layout analysis ; Nano-scale CMOS ; Single event transients ; Soft error ; Soft error rate estimations ; CMOS integrated circuits ; Computer aided design ; Error analysis ; Error correction ; Microprocessor chips ; Transients
  8. Source: Proceedings - Design Automation Conference ; 2013 ; 0738100X (ISSN) ; 9781450320719 (ISBN)
  9. URL: http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=6560693&url=http%3A%2F%2Fieeexplore.ieee.org%2Fxpls%2Fabs_all.jsp%3Farnumber%3D6560693