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Influence of the tip mass on the tip-sample interactions in TM-AFM

Pishkenari, H. N ; Sharif University of Technology | 2011

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  1. Type of Document: Article
  2. DOI: 10.1016/j.ultramic.2011.05.010
  3. Publisher: 2011
  4. Abstract:
  5. This paper focuses on the influences of the tip mass ratio (the ratio of the tip mass to the cantilever mass), on the excitation of higher oscillation eigenmodes and also on the tip-sample interaction forces in tapping mode atomic force microscopy (TM-AFM). A precise model for the cantilever dynamics capable of accurate simulations is essential for the investigation of the tip mass effects on the interaction forces. In the present work, the finite element method (FEM) is used for modeling the AFM cantilever to consider the oscillations of higher eigenmodes oscillations. In addition, molecular dynamics (MD) is used to calculate precise data for the tip-sample force as a function of tip vertical position with respect to the sample. The results demonstrate that in the presence of nonlinear tip-sample interaction forces, the tip mass ratio plays a significant role in the excitations of higher eigenmodes and also in the normal force applied on the surface. Furthermore, it has been shown that the difference between responses of the FEM and point-mass models in different system operational conditions is highly affected by the tip mass ratio
  6. Keywords:
  7. Finite element method ; Higher harmonics ; Molecular dynamics simulations ; Tip mass ratio ; TM-AFM ; AFM cantilevers ; Eigen modes ; Interaction forces ; Normal forces ; Operational conditions ; Tapping-mode atomic force microscopy ; Tip mass ; Tip-sample forces ; Tip-sample interaction ; Vertical positions ; Computer simulation ; Molecular dynamics ; Nanocantilevers ; Accuracy ; Atomic force microscopy ; Controlled study ; Elasticity ; Feasibility study ; Finite element analysis ; Force ; Mathematical model ; Molecular interaction ; Nonlinear system ; Oscillation ; Physical parameters ; Process model ; Process optimization ; Surface property
  8. Source: Ultramicroscopy ; Volume 111, Issue 8 , Jul , 2011 , Pages 1423-1436 ; 03043991 (ISSN)
  9. URL: http://www.ncbi.nlm.nih.gov/pubmed/21864786